installed or planned for intense synchrotron beam lines and X-ray free electron lasers. This type of spectroscopy requires high-energy resolution spectroscopy not only for the incoming X-ray beam but also, in most applications, for the detection of the outgoing photons. Thus, the use of high-resolution X-ray crystal spectrometers whose resolving power ?E/E is typically about 10–4, is mandatory. High-Resolution XAS/XES: Analyzing Electronic Structures of Catalysts covers the latest developments in X-ray light sources, detectors, crystal spectrometers, and photon-in-photon-out core level spectroscopy techniques. It also addresses photon-in-photon-out core level spectroscopy applications for the study of catalytic systems, highlighting hard X-ray measurements primarily due to probe high penetration, enabling in situ studies. This first-of-its-kind book: Discusses high-resolution X-ray emission spectroscopy (XES) and X-ray absorption spectroscopy (XAS) in terms of time-resolved and surface enhancement Supplies an understanding of catalytic reactivity essential for capitalizing on core level X-ray spectroscopy at fourth-generation light sources (XFELs) Describes all spectrometers developed to perform core level X-ray spectroscopy, considering the advantages and disadvantages of each Details methods to elucidate aspects of catalysts under working conditions, such as active sites and molecule adsorption Introduces theoretical calculations of spectra and explores biological as well as heterogeneous catalysts Complete with guidelines and warnings for the use of this type of spectroscopy, High-Resolution XAS/XES: Analyzing Electronic Structures of Catalysts provides a comprehensive overview of the current state of this exciting field.

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