Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics)
by Nelson, Wayne B.- List Price: $208.00
- ISBN-10: 0471522775
- ISBN-13: 9780471522775
- Edition: 1st
- Type: Hardcover
- Publisher: Wiley-Interscience
About The Book
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global... Read more
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