Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
by Egerton, R.F.- List Price: $149.99
- ISBN-10: 0387258000
- ISBN-13: 9780387258003
- Edition: 1st
- Type: Hardcover
- Publisher: Springer
About The Book
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the... Read more
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