Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

by Egerton, R.F.
  • List Price: $179.99
  • ISBN-10: 0387258000
  • ISBN-13: 9780387258003
  • Edition: 1st
  • Type: Hardcover
  • Publisher: Springer

About The Book

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the... Read more

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