VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon...
by Wang, Laung-Terng- List Price: $89.95
- ISBN-10: 0123705975
- ISBN-13: 9780123705976
- Edition: 1st
- Type: Hardcover
- Publisher: Morgan Kaufmann
About The Book
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost,... Read more
FINDING THE BEST PRICES
Related Books
- Year: 2005
- Edition: 2nd
- Publisher: McGraw-Hill Education
- Type: Paperback
- ISBN13: 9780073263199
- ISBN: 0073263192
- Year: -0001
- Edition: 12nd
- Publisher: Pearson
- Type: Hardcover
- ISBN13: 9780136024583
- ISBN: 0136024580
- Year: -0001
- Edition: 10th
- Publisher: Wiley
- Type: Hardcover
- ISBN13: 9780470633229
- ISBN: 0470633220
