VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

by Laung-Terng Wang
  • List Price: $89.95
  • ISBN-10: 0123705975
  • ISBN-13: 9780123705976
  • Edition: 1st
  • Type: Hardcover
  • Publisher: Morgan Kaufmann

About The Book

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost,... Read more

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