VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon...

by Wang, Laung-Terng

List Price: $89.95
ISBN-10: 0123705975
ISBN-13: 9780123705976

Edition: 1st
Type: Hardcover
Publisher: Morgan Kaufmann

About The Book

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost,... Read more

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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon...

About The Book

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Digital Integrated Circuits

Antenna Theory: Analysis and Design, 3rd Edition

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