VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon...

by Wang, Laung-Terng

List Price: $89.95
ISBN-10: 0123705975
ISBN-13: 9780123705976

Edition: 1st
Type: Hardcover
Publisher: Morgan Kaufmann

About The Book

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost,... Read more

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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon...

About The Book

Related Books

Linear Systems and Signals, 2nd Edition

Digital Signal Processing (4th Edition)

Signals and Systems (2nd Edition)

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