VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon...
by Wang, Laung-Terng- List Price: $89.95
- ISBN-10: 0123705975
- ISBN-13: 9780123705976
- Edition: 1st
- Type: Hardcover
- Publisher: Morgan Kaufmann
About The Book
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost,... Read more
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