Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization

Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization

by Dalia G. Yablon
  • List Price: $133.00
  • ISBN-10: 1118288238
  • ISBN-13: 9781118288238
  • Edition: 1st
  • Type: Hardcover
  • Publisher: Wiley

About The Book

Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the... Read more

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