Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

by Wai Kin Chim
  • List Price: $250.00
  • ISBN-10: 047149240X
  • ISBN-13: 9780471492405
  • Edition: 1st
  • Type: Hardcover
  • Publisher: Wiley

About The Book

The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission... Read more

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