In Situ Real-Time Characterization of Thin Films

In Situ Real-Time Characterization of Thin Films

  • List Price: $165.00
  • ISBN-10: 0471241415
  • ISBN-13: 9780471241416
  • Edition: 1st
  • Type: Hardcover
  • Publisher: Wiley-Interscience

About The Book

An in-depth look at the state of the art of in situ real-time monitoring and analysis of thin films With thin film deposition becoming increasingly... Read more

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