Spectroscopic Ellipsometry: Principles and Applications

Spectroscopic Ellipsometry: Principles and Applications

by Hiroyuki Fujiwara
  • List Price: $248.50
  • ISBN-10: 0470016086
  • ISBN-13: 9780470016084
  • Edition: 1st
  • Type: Hardcover
  • Publisher: Wiley

About The Book

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental... Read more

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